The NSLK 8117 V-LISN from Schwarzbeck Mess-Elektronik is designed to measure conducted interference voltages in compliance with VDE, CISPR, and related standards. It ensures a standardized mains connection impedance of 50 Ω || (50 µH + 5 Ω), providing the device under test (DUT) with reliable and consistent performance.
NSLK 8117 Key Features:
- Standardized Impedance: Guarantees accurate measurement conditions for the DUT.
- Interference Suppression: Effectively reduces mains interference voltages, enhancing measurement reliability.
- High-Pass Filtering: Decouples the interference voltage from the DUT via a 7 kHz high-pass filter, directing it to the EMI measurement receiver.
- Choke Configuration: Incorporates a 250 µH choke and a 50 µH choke, connected in series for each path. The 250 µH choke ensures exceptional decoupling between the power supply and the DUT, starting at 9 kHz.
| Topology: | V-LISN |
| Frequency Range: | 9 kHz – 30 MHz |
| Pre-filter choke: | 250 µH |
| Impedance simulation: | 50 Ω || (50 µH + 5 Ω) |
| Max. Current: | 2 x 10 A |
| Max. Voltage: | 250 VAC 50/60 Hz; 350 VDC |
| Supply cable: | IEC Appliance Inlet C14 |
| Connector for EuT: | CEE 7/4 Type F (Schuko) socket |
| Connector for “artificial hand”: | 4 mm laboratory socket with screw terminal 6 mm, not removable |
| Connector to EMI receiver: | BNC socket 50 Ω |
| Dimensions housing (WxHxD): | 105 mm x 108 mm x 263 mm |
| Standard: | CISPR 16-1-2 |